“In operando X-ray nanodiffraction reveals electrically induced bending and lattice contraction in single nanowire device” by Markus Osterhoff
Wallentin_AdMa_2015
- In operando X-ray nanodiffraction reveals electrically induced bending and lattice contraction in single nanowire device
- doi:10.1002/adma.201504188
- Advanced Materials, 2015, 201504188
Hard X-ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub-nm precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance.
- x-ray diffraction, nanowires
-
