Hard x-ray imaging by Multilayer Zone Plates
Combined Optics and Sample Tower
Scanning the sample in the MZP beam
Using the piezo scanner P-733, the sample can be scanned
with a field of view of 30 µm in y/z, in
principle with sub-nm precision.
FIXME
FIXME
FIXME: P-733 scanner with the sample mounted in the MZP x-ray beam (Rendering).
FIXME: See also this animation showing a sample scan.
We have prepared and measured a set of typical 2D scan parameter sets for high-resolution and high-speed STXM-like measurements as summarised below. The line frequencies and number of images are optimised for an Eiger repetition rate of 750 Hz. The measurements have been carried out with a dummy sample holder, the P-733 lying flat down, and using the internal encoders.
| type | frequency | #images | FOV | step | time/2D |
|---|---|---|---|---|---|
| coarse-0.1 | 4 Hz | 75×75 | 83 nm | 1.11 nm | 9.4 s |
| coarse-1.0 | 4 Hz | 75×75 | 837 nm | 11.2 nm | 9.4 s |
| coarse-10 | 4 Hz | 75×75 | 8.5 µm | 113 nm | 9.4 s |
| medium-0.1 | 1⅓ Hz | 255×255 | 92 nm | 0.36 nm | 96 s |
| medium-1.0 | 1⅓ Hz | 255×255 | 921 nm | 3.6 nm | 96 s |
| medium-10 | 1⅓ Hz | 255×255 | 9.2 µm | 36 nm | 96 s |
| fine-0.1 | ⅔ Hz | 510×510 | 91 nm | 0.18 nm | 6½ min |
| fine-1.0 | ⅔ Hz | 510×510 | 914 nm | 1.8 nm | 6½ min |
| fine-10 | ⅔ Hz | 510×510 | 9.2 µm | 18 nm | 6½ min |
| ultrafine-1.0 | ⅓ Hz | 1020×1020 | 910 nm | 0.89 nm | 25½ min |
As can be seen, coarse overview scans are in principle possible within ten seconds; copying the Eiger data files and analysis is not included in these timings. Large-area scans with more than 500 resolution elements (“pixels”, or “scan position”) are possible in a couple of minutes. Such scan speeds have not been possible with the GINIX Pilatus set-up and the current P-611 nanocube scanner.